Dielectric relaxation in Ge1−xSe2Pbx (x=0, 0.2 and 0.6) nano-crystalline system

2004 
Abstract Measurements of the ac conductivity and the dielectric loss of Pb modified Ge 1− x Se 2 Pb x disordered system ( x =0, 0.2 and 0.6) have been carried out in the frequency range 100 Hz–20 kHz and at temperature from 303 to 433 K. The virgin and the x =0.2 samples data shows a normal behavior according to the relation σ ac ( ω )= Aω S . However, the x =0.6 sample behaves differently. The exponent(s) measured for the two modified samples shows sub-linear relation depending on the temperature of measurements. The experimental results of the highly modified sample are interpreted in terms of the coexistence of two parallel conduction mechanisms; the predominance of each depends on both temperature and frequency.
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