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Characterisation of micropores in plasma deposited SiOx films by means of positron annihilation lifetime spectroscopy
Characterisation of micropores in plasma deposited SiOx films by means of positron annihilation lifetime spectroscopy
2020
Christian Hoppe
Felix Mitschker
Maik Butterling
Maciej Oskar Liedke
Teresa de los Arcos
Peter Awakowicz
Andreas Wagner
Guido Grundmeier
Keywords:
positron annihilation
Atomic physics
Physics
Spectroscopy
Plasma
Analytical chemistry
Correction
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