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Using Noise to Study Switching Dynamics of Oxide Memristors
Using Noise to Study Switching Dynamics of Oxide Memristors
2013
Alexander M. Bratkovsky
Wei Yi
G. Medeiros-Ribeiro
R. S. Williams
Sergey Savel’ev
Keywords:
Memristor
Oxide
Electronic engineering
Materials science
Optoelectronics
Correction
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