About the possibility of interval identification of functional dependences at research of semiconductor materials in a cathodoluminescent microscopy

Opportunities of reception of interval estimations of the functional dependence connecting the intensity of monochromatic cathodoluminescence with electron beam energies are considered at the account of casual character of the initial information. The account of casual character of the initial information is carried out with use of the confluence analysis. The methods of mathematical modeling receive interval estimations of functional dependences for directly zoned semiconductors.© (2006) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.