Old Web
English
Sign In
Acemap
>
Paper
>
Unique degradation under AC stress in high-mobility amorphous In-W-Zn-O thin-film transistors
Unique degradation under AC stress in high-mobility amorphous In-W-Zn-O thin-film transistors
2020
Takanori Takahashi
Mami N. Fujii
Ryoko Miyanaga
Miki Miyanaga
Yasuaki Ishikawa
Yukiharu Uraoka
Keywords:
Amorphous solid
Optoelectronics
Degradation (geology)
Chemistry
Thin-film transistor
Analytical chemistry
Correction
Source
Cite
Save
Machine Reading By IdeaReader
33
References
4
Citations
NaN
KQI
[]