Circuit-Level Soft Error Rate Evaluation Approach Considering Single-Event Multiple Transient
2019
Soft error rate (SER) evaluation for integrated circuit has become a hot issue. With the technology scaling, single event multiple transient (SEMT) needs to be considered in the SER evaluation. This paper proposed a novel SER evaluation approach. It can consider SEMT induced soft errors. Simulation results confirm the capability of the proposed SER evaluation approach.
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