The weighted index method: a new technique for analyzing planar optical waveguides

A method of analyzing optical waveguides called the weighted-index technique is presented. It is particularly appropriate for planar geometries with abrupt refractive index profiles, such as semiconductor waveguides. The method is an extension of the simple effective-index and transverse-resonance methods and has a strong physical foundation. The weighted-index method is shown to give more accurate results and be valid for a wider range of structures. Although it is more complicated than the effective-index method, it can be implemented on the smallest of personal computers. >