Antireflection properties of diamond-like carbon films on Cd1 − x Zn x Te (x ∼ 0.04) single crystals

The optical properties of diamond-like carbon (DLC) films obtained by plasmachemical deposition on Cd1 − x Zn x Te (x ∼ 0.04) single crystals have been studied by ellipsometry. The ellipsometric data have been interpreted within the framework of a three-layer model of the DLC film-semiconductor crystal refractory system with transition layers between the film and substrate. It is found that DLC films exhibit antireflection properties in this refractory system in the IR spectral range. It is established that the proposed antireflection film-substrate structure is stable with respect to thermal cycling and ultrasonic treatment.