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Electronic Components Exposed To Nuclear Radiations In Iter Diagnostic Systems: Current Investigations And Perspectives
Electronic Components Exposed To Nuclear Radiations In Iter Diagnostic Systems: Current Investigations And Perspectives
2016
Vincent Martin
L. Bertalot
J.-M. Drevon
R. Reichle
S. Simrock
G. Vayakis
M. J. Walsh
Jens Verbeeck
Ying Cao
Marco Van Uffelen
Keywords:
Nuclear engineering
Electronic component
Materials science
Engineering
diagnostic system
Correction
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