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Microstructure evolution and hard x-ray reflectance of ultrathin Ru/C multilayer mirrors with different layer thicknesses
Microstructure evolution and hard x-ray reflectance of ultrathin Ru/C multilayer mirrors with different layer thicknesses
2021
Yang Liu
Qiushi Huang
Runze Qi
Liangxing Xiao
Zhong Zhang
Wenbin Li
Shengzhen Yi
Zhanshan Wang
Keywords:
Reflectivity
Materials science
X-ray
Composite material
Microstructure
Correction
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