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Tearing mode structure study using tangential EUV/SXR diagnostic system on HBT-EP tokamak
Tearing mode structure study using tangential EUV/SXR diagnostic system on HBT-EP tokamak
2020
B Li
J.P. Levesque
G.A. Navratil
M.E. Mauel
I. G. Stewart
A Saperstein
R.N. Chandra
C. Hansen
Keywords:
Extreme ultraviolet lithography
Mode (statistics)
Tearing
Tokamak
Optics
Heterojunction bipolar transistor
Physics
diagnostic system
Correction
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