Social exclusion and the plight of asylum seekers living in Ireland

A method for accurately extracting capacitance and inductance parasitics from an electrical network representing a three-dimensional wiring of an integrated circuit chip or module is described. The extraction process can be performed either prior to or after completing a detailed wiring of the chip. In the former case, the method utilizes congestion information and approximate wiring length data to estimate the probability of encountering a particular pattern and the most accurate estimated capacitance which can arrived at. In the latter case, the wiring is partitioned into three-dimensional recognizable patterns, and a database of precomputed parasitics for each pattern is queried in order to obtain highly accurate parasitics within a limited number of machine cycles. The number of patterns is assumed to be sufficiently small to be memory and time efficient and to be arrived at in real-time.