X-ray spectroscopy of multicharged xenon ions at the EBIT plasma

X-ray spectra of multicharged xenon ions created in an electron-beam ion trap (EBIT) were measured both with a low-resolution silicon drift detector (SDD) and a high-resolution Johann/Johannson type crystal diffraction spectrometer. The measurement were performed in the electron-beam ion source (EBIS) using the transmission, leaky and pulsed modes of the ion source operation with trapped xenon ions excited by an electron beams of energies 9-15 keV. Moreover, the dynamics and equilibration of the EBIT plasma was studied by measuring the X-ray spectra for different electron energies and trapping times. The results will be discussed using available theoretical models describing the atomic processes in the EBIT plasma.