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(Invited) Reliability of Ultra Nano-sheet InWO Thin Film Transistor for Back-end of Line Applications
(Invited) Reliability of Ultra Nano-sheet InWO Thin Film Transistor for Back-end of Line Applications
2020
Po-Tsun Liu
Zhen-hao Li
Po-Yi Kuo
Yi-Syuan Lin
Chung-Hao Tien
Keywords:
Thin-film transistor
Back end of line
Optoelectronics
Materials science
Nano-
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