Dislocation emission in A1 during recrystallization

The dislocation structure evolution during isothermal recrystallization of Al has been followed by means of internal friction, modulus defect and X-ray diffraction analyses accompanying the microscopical observations. Many peaks ofQ −1 and of modulus defect and X-ray diffraction line width have been found, both in nucleation and grain growth, all referable to dislocations. The first of these peaks, at the beginning of recrystallization, presents recovery characteristics, different from those shown by the subsequent, secondary peaks. Secondary peaks are interpreted in terms of dislocation emission from grain boundaries, whereas the first peak appears connected with subboundaries, walls present in the initial stages of recrystallization.