A method for high-resolution imaging of a local structure in a sample

For high-resolution imaging of a labeled with luminescent labels structure in a sample of light (2), which affects the emission of luminescence light by the luminescent marker, directed at an intensity distribution on the sample, the adjacent one of the intensity maxima (3) root (4) , A part to be scanned region of the sample is scanned with the zero point (4), and from the area of ​​the zero point (4) emitted luminescent light is registered, and the location of the zero point (4) is associated in the sample. Dimensions of the scanned portion of the sample in at least one direction in which the intensity maxima (3) the zero point (4) are adjacent in the sample are thereby so limited that they are not greater than 75% of a distance (D