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Evaluation of surface diffusion lengths during InGaN growth by rf-MBE
Evaluation of surface diffusion lengths during InGaN growth by rf-MBE
2016
Kohei Date
Hiroto Sekiguchi
Ai Yanagihara
Keisuke Yamane
Hiroshi Okada
Akihiro Wakahara
Katsumi Kishino
Keywords:
Analytical chemistry
Surface diffusion
Materials science
Optoelectronics
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