Temperature Sensor with Process and Mismatch Auto-Compensation Technique in 28 nm CMOS

This work concerns the design of a temperature sensor for multi-purpose pattern recognition applications designed in a 28 nm CMOS technology. The sensor resolution is 1°C between −40°C and 125°C. A vertical bipolar transistor is used as the sensing element generating the reference for the Analog-to-Digital Converter (ADC), based on a dual slope, Wilkinson architecture. An auto-compensation technique has been implemented in order to mitigate process variations, mainly dominated by the contributions of the current reference circuit.