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Acemap > Paper > Application of Synchrotron Radiation Based X-ray Reflectometry in Analysis of TiO2 Nanolayers, Unmodified and Irradiated with Xeq+ Ions

Application of Synchrotron Radiation Based X-ray Reflectometry in Analysis of TiO2 Nanolayers, Unmodified and Irradiated with Xeq+ Ions

2020 
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