NIST HAXPES at NSLS and NSLS-II

C. Weiland,Cherno Jaye,Nicholas F. Quackenbush,Eliot Gann,Zugen Fu,Johnny P. Kirkland,B. Karlin,Bruce Ravel,Joseph C. Woicik,Daniel A. Fischer

NIST HAXPES at NSLS and NSLS-II

2018

C. Weiland
Cherno Jaye
Nicholas F. Quackenbush
Eliot Gann
Zugen Fu
Johnny P. Kirkland
B. Karlin
Bruce Ravel
Joseph C. Woicik
Daniel A. Fischer

Hard X-ray photoelectron spectroscopy (HAXPES) provides numerous exciting opportunities to deepen our understanding of materials chemistry and electronic structure, as is evident from recent review...

Keywords:

Nuclear magnetic resonance
NIST
Physics
Optics

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