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Dielectric breakdown characteristics studied by scanning probe microscopy under ultrahigh vacuum
Dielectric breakdown characteristics studied by scanning probe microscopy under ultrahigh vacuum
2013
M. Kogelschatz
R. Foissac
S. Blonkowski
P. Delcroix
C. Sire
Keywords:
Scanning probe microscopy
Dielectric strength
Analytical chemistry
Materials science
Optoelectronics
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