A Sub-Micron Spherical Atomic Force Microscopic Tip for Surface Measurement.

Huan Hu,Bin Shi,C. M. Breslin,Lynne M. Gignac,Yitian Peng

A Sub-Micron Spherical Atomic Force Microscopic Tip for Surface Measurement.

2020

Huan Hu
Bin Shi
C. M. Breslin
Lynne M. Gignac
Yitian Peng

We report a novel methodology of fabricating sub-micron spherical atomic force microscope (AFM) tip controllably - a silicon sub-micron sphere atop microcantilevers, which is desired for precise na...

Keywords:

Atomic force microscopy
surface measurement
Micrometre
Chromatography
Chemistry
Silicon
Optoelectronics

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