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Use of micro-beam PIXE and NRA in postmortem analysis of samples exposed in plasma devices
Use of micro-beam PIXE and NRA in postmortem analysis of samples exposed in plasma devices
2018
M Kelemen
A. Založnik
M. Pecovnik
Primož Vavpetič
P. Pelicon
An. Hakola
M. Laan
S. Kapser
S. Markelj
Keywords:
Plasma
Analytical chemistry
Beam (structure)
Materials science
Radiochemistry
Correction
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