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Live observation of interface phenomena by wavelength-dispersive X-ray CTR scattering
Live observation of interface phenomena by wavelength-dispersive X-ray CTR scattering
2019
Tetsuroh Shirasawa
Wolfgang Voegeli
Etsuo Arakawa
Toshio Takahashi
Takuya Masuda
Kohei Uosaki
Keywords:
Thin film
Spectroscopy
Scattering
X-ray
X-ray crystallography
Wavelength
Optics
X-ray spectroscopy
Diffraction
Correction
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