Wrinkling of flexoelectric nano-film/substrate systems

The study of wrinkling mechanisms essentially helps to establish stable and controllable performance in electronic products. To gain some basic understanding of the wrinkling process in flexoelectric dielectrics, this paper models the wrinkling of nano-film/substrate systems, typically seen in stretchable electronics, subjected to substrate prestrain and voltage loading on electrodes. Flexoelectricity is considered through the constitutive equations proposed by Shen and Hu, and Euler–Bernoulli beam theory is applied to formulate the expressions of wrinkling wavelength and amplitude through the Ritz method. The effects of flexoelectricity, surface parameters, prestrain, applied voltage, structural scale etc on wrinkling behaviors, including wrinkling deformation and the wrinkling critical condition, are discussed. Results reveal that the action of both flexoelectric and surface effects is significant over only a small scale range, with film thickness less than 10 nm. Alongside these issues, the fundamental difference between flexoelectric and piezoelectric effects on wrinkling behaviors is highlighted. Piezoelectricity may act as a promoter or suppressor of wrinkling initiation and amplitude, depending on the applied voltage, while flexoelectricity not only reduces the critical prestrain or voltage required for wrinkling, but also decreases the wrinkling wavelength and amplitude.