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Wafer Pattern Recognition for Detecting Process Abnormalities in NAND Flash Memory Manufacturing
Wafer Pattern Recognition for Detecting Process Abnormalities in NAND Flash Memory Manufacturing
2021
Jeongin Choe
Kim Taehyeon
Saetbyeol Yoon
Sangyong Yoon
Ki-whan Song
Jai Hyuk Song
Myung Suk Kim
Woo Young Choi
Keywords:
Wafer
Process (computing)
Pattern recognition (psychology)
Computer hardware
nand flash memory
Computer science
Correction
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