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Depth profiling of thin film solar cell components by synchrotron excited Soft X-ray emission spectroscopy (SXES)
Depth profiling of thin film solar cell components by synchrotron excited Soft X-ray emission spectroscopy (SXES)
2007
Harry Möenig
A. Grimm
Martha Ch. Lux-Steiner
Rodrigo Sáez-Araoz
Christian-Herbert Fischer
Markus Baer
Christian Camus
Ahmed Ennaoui
Christian A. Kaufmann
Paul Koerber
Timo Kropp
Iver Lauermann
Sebastian Lehmann
Tim Muenchenberg
Paul Pistor
S. Puttnins
Hans-Werner Schock
Stefan Sokoll
Christian Jung
Keywords:
Spectroscopy
Optoelectronics
Thin film
Soft X-ray emission spectroscopy
X-ray spectroscopy
Synchrotron
Synchrotron radiation
Excited state
Emission spectrum
Materials science
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