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Characterization of irradiated p-type silicon detectors for TCAD surface radiation damage model validation
Characterization of irradiated p-type silicon detectors for TCAD surface radiation damage model validation
2020
A. Morozzi
F. Moscatelli
G Lombardi
G. M. Bilei
V. Hinger
Thomas Bergauer
Daniele Passeri
Keywords:
Detector
Optics
Radiation damage
Irradiation
Physics
Silicon
model validation
p type silicon
Correction
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