Dielectronic recombination and related resonance processes

Abstract We review recent progress in understanding of the atomic process known as dielectronic recombination (DR). Currently applied schemes for the calculation of DR cross sections and rate coefficients are described in detail. Methods of dealing with such problems as cascade correction, configuration interaction, and angular momentum coupling are considered. Both two-electron and multi-electron systems are treated. Results obtained by these methods are presented for ions of the He, Li, B, F, Na, Mg, and K isoelectronic sequences. Other results are referenced. Semiempirical formulas for DR rate coefficients are discussed. The recently discovered electric field effect in DR is described. The connection to DR of other resonance processes such as photo-Auger ionization, resonance transfer excitation, and resonance excitation is explained.