Measurement of Refractive Index, Specific Heat Capacity, and Thermal Conductivity for Ag6.0In4.5Sb60.8Te28.7 at High Temperature

We have measured the temperature dependence of refractive index, thermal conductivity (K) and specific heat capacity (C) for Ag6.0In4.5Sb60.8Te28.7 (AIST). For measurement of refractive index, a spectroscopic ellipsometry was employed over a wavelength range from 300 to 1700 nm whilst the temperature was increased from room temperature to 450 °C. For measurement of K, we used a novel instrument called "a nanosecond thermoreflectance measurement system" developed by Baba et al. Using this system, it is possible to easily obtain the K of thin film samples which range in thickness from sub-micron down to 100 nm. We measured the Ks up to 400 °C; a clear temperature dependence was observed whereby Ks increased with increasing temperature. For measurement of C, we used a differential scanning calorimeter. The C of AIST also increase before the melting point (530 °C); after melting the C rapidly decreased with increasing temperature.