Influence of Time-of-Flight Chromatic Aberration on the Dynamics of Propagation of Pulsed Electron Beam in Ultrafast Electron Microscopy: A New Strategy for Better Temporal Resolution

A common strategy aimed at achieving a high temporal resolution in ultrafast electron microscopy and diffraction is based on the use of strong electrostatic fields in the accelerating gap to form fast electron pulses of ultrashort duration. In this work, the dynamics of the propagation of ultrashort photoelectron bunches is studied taking into account the time-of-flight chromatic aberration: the spread-out of electron pulses at the exit from the region of the accelerating electric field. The results of the calculation of the duration of photoelectron pulses taking into account Coulomb repulsion are presented. According to the analysis, the use of strong electrostatic fields in the accelerating gap for the formation of fast electron pulses of ultrashort duration is not a necessary condition for achieving the final high temporal resolution in the method of ultrafast electron microscopy. The modes of operation of ultrafast transmission electron microscope were found for which the temporal resolution increases with the growth of time-of-flight chromatic aberration.