Detector Part of the Station for the Research and Irradiation of Promising Products of Semiconductor Micro- and Nanoelectronics with High-Energy Ion Beams

In this paper, the authors present the composition of a prototype of the Detector Part of the Station (DPS) that uses a novel method for studying the integrated circuit durability to single-event effects (SEEs) during operation in outer space. The prototype operability is verified using Monte Carlo simulation.