A Fast Topographic Correction Method for TEM Data

Topography affects electromagnetic data and leads to wrong interpretation of shallow resistivity layers. In this paper, we propose a new method for correcting topographic error in electromagnetic data. In order to achieve this, we used a small DC configuration to obtain the surface resistivity, and then used the surface resistivity to construct a new topographic correction formula. Both synthetic and field TEM and CSAMT data were processed using this method. The results show that our method is a fast, effective and practical tool for correcting topographic effects in electromagnetic data.