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A supervised learning approach for prediction of x-ray computed tomography data from ultrasonic testing data
A supervised learning approach for prediction of x-ray computed tomography data from ultrasonic testing data
2019
Daniel Sparkman
Sarah Wallentine
Mark Flores
John N. Wertz
John T. Welter
Norm Schehl
Josiah Dierken
David Zainey
John C. Aldrin
Mike D. Uchic
Keywords:
Supervised learning
Ultrasonic testing
Artificial intelligence
x ray computed
Pattern recognition
Tomography
Materials science
Correction
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