Analysis of the local structure of AlN:Mn using X‐ray absorption fine structure measurements

The local structure around the Mn atoms in MOCVD-grown AlN:Mn films which show Mn-related red-orange photoluminescence with a 600nm-peak at room temperature was investigated using the X-ray absorption fine structure (XAFS) measurements. We found that Mn atoms occupy Al lattice sites in the AlN film and that the Mn ions have a charge between +2 and +3. From these results, we think that the red-orange luminescence is caused by the transition of d-electrons in the Mn ions. (© 2006 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)