100W 1st generation laser-produced plasma light source system for HVM EUV lithography
2011
We reported 1st generation Laser-Produced Plasma source system "ETS" device for EUV lithography one year
ago1). In this paper we update performance status of the 1st generation system. We have improved the system
further, maximum burst power is 104W (100kHz, 1 mJ EUV power @ intermediate focus), laser-EUV conversion
efficiency is 2.5%. Also continuous operation time is so far up to 8 hours with 5% duty cycle is achieved. We have
investigated EUV plasma creation scheme by small experimental device which is facilitated 10Hz operation
(maximum). We have proposed double pulse method to create LPP plasma efficiently. This moment we found out
3.3% conversion efficiency operation condition.
Based on the engineering data of ETS and small experimental device, now we are developing 2nd generation
HVM source; GL200E. The device consists of the original concepts (1) CO 2 laser driven Sn plasma, (2) Hybrid
CO 2 laser system that is combination of high speed (>100kHz) short pulse oscillator and industrial cw-CO 2 , (3)
Magnetic mitigation, and (4) Double pulse EUV plasma creation. The preliminary data are introduced in this paper.
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