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P‐9: Reduction and Mechanism of ESD Defect in IGZO‐TFT Formation
P‐9: Reduction and Mechanism of ESD Defect in IGZO‐TFT Formation
2019
Liu Tianzhen
Xianxue Duan
Dezhi Xu
Cui Haifeng
Zhihai Zhang
Yangsik Youn
Junsheng Chen
Seungkyu Lee
Keywords:
Thin-film transistor
Optoelectronics
Materials science
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