Low-jitter electrooptic sampling of active mm-Wave devices up to 300 GHz
2013
In this work we present an electrooptic sampling system for on-wafer characterization of ultrafast active electronic devices. The system capabilities are demonstrated on a prototype 65 nm CMOS nonlinear transmission line circuit. Device operation and sampling up to 300 GHz is achieved by diminishing the relative time jitter between source and sampler.
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