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Focused Ion Beam / Lift out Cross Sectioning of Thin Film Lamellar Composite Structures
Focused Ion Beam / Lift out Cross Sectioning of Thin Film Lamellar Composite Structures
1999
Henry S. White
Miriam H. Rafailovich
Jonathan C. Sokolov
S. W. King
Abraham Ulman
Rainer Jordan
Hao-Xue Lin
Czesëaw Urbanik
L. F. Gianuzzi
Keywords:
Lamellar structure
Thin film
Focused ion beam
Lift (force)
Analytical chemistry
Polymer blend
Copolymer
Transmission electron microscopy
Materials science
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