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Novel thin film lift-off process for in situ TEM tensile characterization
Novel thin film lift-off process for in situ TEM tensile characterization
2021
Krishna Kanth Neelisetty
Shyam Kumar Cn
Ankush Kashiwar
Torsten Scherer
V.S. Kiran Chakravadhanula
Christian Kuebel
Keywords:
In situ
characterization
Lift (force)
Ultimate tensile strength
Materials science
Composite material
process
Thin film
Correction
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