The Swift X-ray Telescope Cluster Survey - II. X-ray spectral analysis

(Abridged) We present a spectral analysis of a new, flux-limited sample of 72 X-ray selected clusters of galaxies identified with the X-ray Telescope (XRT) on board the Swift satellite down to a flux limit of ~10-14 erg/s/cm2 (SWXCS, Tundo et al. 2012). We carry out a detailed X-ray spectral analysis with the twofold aim of measuring redshifts and characterizing the properties of the Intra-Cluster Medium (ICM). Optical counterparts and spectroscopic or photometric redshifts are obtained with a cross-correlation with NED. Additional photometric redshifts are computed with a dedicated follow-up program with the TNG and a cross-correlation with the SDSS. We also detect the iron emission lines in 35% of the sample, and hence obtain a robust measure of the X-ray redshift zX. We use zX whenever the optical redshift is not available. Finally, for all the sources with measured redshift, background-subtracted spectra are fitted with a mekal model. We perform extensive spectral simulations to derive an empirical formula to account for fitting bias. The bias-corrected values are then used to investigate the scaling properties of the X-ray observables. Overall, we are able to characterize the ICM of 46 sources. The sample is mostly constituted by clusters with temperatures between 3 and 10 keV, plus 14 low-mass clusters and groups with temperatures below 3 keV. The redshift distribution peaks around z~0.25 and extends up to z~1, with 60% of the sample at 0.1X-ray telescopes. Our results have interesting implications for the design of future X-ray survey telescopes, characterised by good-quality PSF over the entire field of view and low background.