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RHEED Spot Profile Measurements Performed on Ag/Si(111)
RHEED Spot Profile Measurements Performed on Ag/Si(111)
2003
Lynn M. Nagle
Gregory Michael Rutter
J. Lozano
Paul W. Wang
Kelly Ryan Roos
Kevin R. Kimberlin
Michael C. Tringides
Keywords:
Specular reflection
Molecular beam epitaxy
Reflection high-energy electron diffraction
Layer by layer
Analytical chemistry
Optics
Chemistry
Correction
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