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Switching Reliability of SiC-MOSFETs Containing Expanded Stacking Faults
Switching Reliability of SiC-MOSFETs Containing Expanded Stacking Faults
2018
Ryusei Fujita
Kazuki Tani
Kumiko Konishi
Akio Shima
Keywords:
Composite material
Stacking
Materials science
Correction
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