Galvanomagnetic Properties of Bismuth–Antimony Films under Conditions of Plane Tensile Strain

The results of studying the resistivity, magnetoresistance, and Hall coefficient of thin films of bismuth and the bismuth–antimony system on a borosilicate-glass substrate under plane tensile strain are presented. Deformation is created by a specially developed method that allows a change in its magnitude directly during measurement of the film properties. The films are obtained by thermal evaporation in vacuum. Varying the technological modes made it possible to obtain films of various structures: from small blocks to single crystal. Based on the experimental results, within the framework of the two-band approximation, the concentrations of charge carriers and the positions of the energy extrema of the valence and conduction bands relative to the chemical potential level are calculated. It is shown that the two-band approximation is insufficient for describing the properties of films of the studied compositions under plane tensile strain.