Generation and use of parametric X-ray by LINAC

Parametric X-rays (PXR) were generated in the 6˜15keV region to examine the generation and use of PXR by LINAC. The target crystal was a Si single crystal, and the FWHMs of the PXR spectra were obtained at about 350eV by a Si-PIN photo diode detecter with 250eV FWHM at 5.9keV (55Fe). The experiments found that it was possible to select a crystal rotaion angle, detection angle, crystal thickness, crystal material, and interference plane to enhance the PXR intensity. Moreover, in theexperiment for use of PXR, the mass attenuation coefficient around the K-edge could be measured accurately in a narrow range with PXR. The results support that the PXR is a good monochromatic hard X-ray souce, where the energy can be countinuously changed.