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Ti/Al/Ni/AuのOhm接触を用いたAlGaN/GaN高電子移動度トランジスタにおけるナノ亀裂形成【Powered by NICT】
Ti/Al/Ni/AuのOhm接触を用いたAlGaN/GaN高電子移動度トランジスタにおけるナノ亀裂形成【Powered by NICT】
2017
P. G. Whiting
Nicholas G. Rudawski
M. R. Holzworth
S. J. Pearton
K. S. Jones
Lu Liu
Tsung-Sheng Kang
F. Ren
Keywords:
Engineering
Electronic engineering
Mechanical engineering
Engineering physics
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