Developments of detection of X-ray scattering in combustion - characterization of noise levels of an A/D sampling device

A simple investigation about the noise of the acquisition cards NI PXI-4495, provided by National Instruments, was performed. Standard deviations were calculated for data acquired from a signal generator, a constant voltage source and when the input channels were grounded, to estimate the noise. The obtained noise is in the order of a few millivolts when acquiring signals from the devices while the noise when grounding the system is in the order of microvolts. The device's ability to resolve the presence of graphite in a simple model of a graphite/air mixture is presented. Possible situations in which the acquisition device can be utilized are when measuring single event processes. Measurements on combustion engines or chemical reactors are two proposed situations. (Less)