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Enhancing reliability of InGaN/GaN light-emitting diodes by controlling the etching profile of the current blocking layer
Enhancing reliability of InGaN/GaN light-emitting diodes by controlling the etching profile of the current blocking layer
2020
Shui-Hsiang Su
Chun-Lung Tseng
Ching-Hsing Shen
I-Jou Hsieh
Yen-Sheng Lin
Keywords:
Light-emitting diode
Optoelectronics
Etching
Materials science
blocking layer
Correction
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