Toward ultra thin CIGS solar cells

In this paper, we present our results on the fabrication of solar cells down to thicknesses of 0.5 µm, and how real time and in situ analysis by spectroscopic ellipsometry (SE) can help in (i) understanding the results of the devices; and (ii) modeling the growth and properties of the CIGS solar cell. These in situ and real time measurements are correlated with ex situ structural measurements of the films such as XRD and AFM; broad spectral range optical measurements of the films and devices such as TR and device specific measurements such as I–V and QE measurements.