Synthesis and electronic properties of SiCl4- GIC

Abstract A typical chloride of group IV element, SiCl 4 , has been intercalated into graphite using two temperature furnace method with excess chlorine gas. A variety of the stages has not yet been obtained. X-ray analysis shows a repeat distance along the c-axis of 26.83 A in a sample, which is close to an integer multiple of the layer distance of pristine graphite, 3.35 A. The SiK absorption spectrum was measured in the soft X-ray range. The chemical shift and the line shape agrees well with that of SiO 2 , indicating that the intercalant species were changed from SiCl 4 to the oxide. Resistivity and Hall effect were measured and the density and mobility of the carriers were deduced. The small carrier density obtained is attributed to a small charge transfer rate of about 0.04 per intercalant.